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Book Chapters

  1. F. Ferdaus and M. T. Rahman, “Security of Emerging Memory Chips,” in Emerging Topics in Hardware Security by Mark M. Tehranipoor, Springer, 2020.
  2. M. T. Rahman, D. Forte, M. Tehranipoor, “Protection of Assets from Scan Chain Vulnerabilities through Obfuscation,” in Hardware Protection through Obfuscation by Domenic Forte, Swarup Bhunia, and Mark M. Tehranipoor, Springer, 2017. link
  3. M. T. Rahman, “Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly” in Counterfeit Integrated Circuits: Detection and Avoidance, Springer, 2015.link

Journal Papers

  1. F. Ferdaus, B. M. S. Bahar Talukder, and M. T. Rahman, “Hiding Information for Secure and Covert Data Storage in Commercial ReRAM Chips,” IEEE Transactions on Information Forensics and Security (TIFS), 2024 (in press). [Preprint Link]
  2. M. S. Awal and M. T. Rahman, “Impedance Leakage Vulnerability and its Utilization in Reverse-engineering Embedded Software,” IEEE Transactions on Information Forensics and Security (TIFS), 2023 (under review) [ImpedanceLeakage]
  3. Harshdeep Singh, Niraj Prasad Bhatta, Fathi Amsaad, and M. T. Rahman, “Accelerated Aging Effects on SRAM PUF reliability at various Temperature and Voltage conditions” in Journal of Hardware and Systems Security Springer, 2023 (under review).
  4. Mehdi Sadi, BMS Bahar Talukder, Kaniz Mishty, M. T. Rahman, “Attacking Deep Learning AI Hardware with Universal Adversarial Perturbation.” in MDPI Information, 2023 [Link]
  5. Talukder, B. M. S., F. Ferdaus, and M. T. Rahman. “A Non-invasive Technique to Detect Authentic/Counterfeit SRAM Chips.” in ACM Journal on Emerging Technologies in Computing Systems,2023. [link]
  6. M. S. Awal, A. Madanayake and M. T. Rahman, “Nearfield RF Sensing for Feature-Detection and Algorithmic Classification of Tamper Attacks,” in IEEE Journal of Radio Frequency Identification, vol. 6, pp. 490-499, 2022. [Link]
  7. F. Ferdaus, B. M. S. Bahar Talukder, and M. T. Rahman, “Approximate MRAM: High-performance and Power-efficient Computing with MRAM Chips for Error-tolerant Applications,” in IEEE Transactions on Computers, 2022. [Link]
  8. Bepary, Md Kawser, Bashir Mohammad Sabquat Bahar Talukder, and M. T. Rahman, “DRAM Retention Behavior with Accelerated Aging in Commercial Chips” Applied Sciences 12, no. 9: 4332, 2022. [Link]
  9. B. M. S. Bahar Talukder, F. Ferdaus, and M. T. Rahman, “Memory-Based PUFs are Vulnerable as Well: A Non-Invasive Attack Against SRAM PUFs,” in IEEE Transactions on Information Forensics and Security (TIFS), vol. 16, pp. 4035-4049, 2021. [Link]
  10. M. I. Rashid, F. Ferdaus, B. M. S. B. Talukder, A. Beal, and M. T. Rahman, “True Random Number Generation Using Latency Variations of FRAM”  in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2020. [Link]
  11. S. Sakib, A. Milenkovic, M. T. Rahman, and B. Ray, “An Aging-Resistant NAND Flash Memory Physical Unclonable Function” in IEEE Transactions on Electron Devices, Feb. 2020. [Link]
  12. B. M. S. B. Talukder, B. Ray, D. Forte, and M. T. Rahman, “PreLatPUF: Exploiting DRAM Latency Variations for Generating Robust Device Signatures,” in IEEE Access, 2019. [pdf]
  13. S. Sakib, P. Kumari, B. M. S. Bahar Talukder, M. T. Rahman, and B. Ray, “Non-Invasive Detection Method for Recycled Flash Memory using Timing Characteristics” Cryptography, vol. 2, no. 3, p. 17, Aug. 2018. [pdf].
  14. D. Zhang, X. Wang, M. T. Rahman, and M. Tehranipoor, “An On-Chip Dynamically-Obfuscated Wrapper for Protecting Supply Chain Against IP and IC Piracy,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2018 [pdf].
  15. Z. Guo, X. Xu, M. T. Rahman, M. Tehranipoor, D. Forte, “SCARe: An SRAM-based Countermeasure Against IC Recycling,” IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2017. [pdf]
  16. M. T. Rahman, A. Hosey, Z. Guo, D. Forte, M. Tehranipoor, “Systematic Correlation and Cell Neighborhood Analysis of SRAM-PUF for Robust and Unique Key Generation,.” in Journal of Hardware and Systems Security (HaSS), 2017.
  17. M. T. Rahman, F. Rahman, D. Forte, M. Tehranipoor, “An Aging-Resistant RO-PUF for Reliable Key Generation,” IEEE Transactions on Emerging Topics in Computing (TETC), 2015.
  18. A. Mazady, M. T. Rahman, D. Forte, M. Anwar, “Memristor Nano-PUF A Security Primitive: Theory and Experiment,” in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS).

Conference Papers

  1. Alejandro Almeida, Muneeba Asif, Md Tauhidur Rahman, and Mohammad Ashiqur Rahman, “Side-channel-driven Intrusion Detection System for Mission Critical Unmanned Aerial Vehicles”, in International Symposium on Quality Electronic Design, 2024.
  2. Md Sadik Awal and Md Tauhidur Rahman, “Disassembling Software Instruction Types through Impedance Side-channel Analysis” in IEEE Hardware-Oriented Security and Trust Symposium (HOST), 2023. [link]
  3. Harshdeep Singh, Niraj Prasad Bhatta, K M Tawsik Jawad, Ashutosh Ghimire, Md Tauhidur Rahman, and Fathi Amsaad, “Evaluating the Robustness of SRAM Physical Unclonable Functions: Empirical Investigations.” in IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS, 2023.
  4. Niraj Prasad Bhatta, Harshdeep Singh, Ashutosh Ghimire, Md Tauhidur Rahman, and Fathi Amsaad, “Aging of SRAM PUFs: Mitigation and Advancements through Machine Learning Techniques.” in IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS, 2023.
  5. Ashutosh Ghimire, Fathi Amsaad, Tamzidul Hoque,  Kenneth Hopkinson, and Md Tauhidur Rahman “Unsupervised IC Security with Machine Learning for Trojan Detection.” in International Midwest Symposium on Circuits & Systems (MWSCAS) 2023. [HT_detection_MWSCAS__Final_]
  6. Md Sadik Awal, Christopher Thompson, and Md Tauhidur Rahman, “Utilization of Impedance Disparity Incurred from Switching Activities to Monitor and Characterize Firmware Activities”  in IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS, 2022. Link
  7.  Ferdaus, Farah, Bashir Mohammad Sabquat Bahar Talukder, and Md Tauhidur Rahman. “Watermarked ReRAM: A Technique to Prevent Counterfeit Memory Chips.” Proceedings of the Great Lakes Symposium on VLSI 2022. 2022. link
  8.  F. Ferdaus, B. M. S. Bahar Talukder, M. Sadi and M. T. Rahman, “True Random Number Generation using Latency Variations of Commercial MRAM Chips,” 2021 22nd International Symposium on Quality Electronic Design (ISQED), 2021, pp. 510-515. link
  9.  M. K. Hossain, M. I. Rashid, M. R. Haider, and M. T. Rahman, “Randomized Pulse-Based Encoding for Secure Wireless Data Communications” in IEEE 63rd International Midwest Symposium on Circuits & Systems (MWSCAS), 2020. link
  10. M. A. Rahman, M. T. Rahman, M. C. Kisacikoglu, and K. Akkaya, “Hardware-Enabled Intrusion Detection for Power Electronics Security in Unmanned Aerial Vehicles” to appear in IEEE CyberPELS, 2020.
  11. B. M. S. Bahar Talukder, V. Menon, T. Neal, B. Ray, and M. T. Rahman, “Towards the Avoidance of Counterfeit Memory: Identifying the DRAM Origin” in IEEE Hardware-Oriented Security and Trust Symposium (HOST), 2020. [Arxiv Link]
  12.  K. Worley and M. T. Rahman, “Supervised Machine Learning Techniques for Trojan Detection with Ring Oscillator Network,” in IEEE SouthEastCon, 2019 (UG research) [pre-print]
  13. S. Sakib, M. T. Rahman, A. Milenkovic, and B. Ray, “Flash Memory Based Physical Unclonable Function,” to appear in IEEE SouthEastCon, 2019 [pdf]
  14.  B. M. S. Bahar Talukder, Joseph Kerns, Biswajit Ray, Thomas Morris, and M. T. Rahman, “Exploiting DRAM Latency Variations for Generating True Random Numbers,” in IEEE International Conference on Consumer Electronics (ICCE), 2019. [pdf], [IEEE Link]
  15.  P. Kumari, B. M. S. Bahar Talukder, S. Sakib, B. Ray and M. T. Rahman, “Independent Detection of Recycled Flash Memory: Challenges and Solutions,” in IEEE Hardware-Oriented Security and Trust Symposium (HOST), 2018. (acceptance rate: 20.2%) [pre-print]
  16. X. Wang, Y. Guo, M. T. Rahman, D. Zhang, and M. Tehranipoor, “DOST: Dynamically Obfuscated Wrapper for Split Test against IC Piracy,” IEEE Asian Hardware-Oriented Security and Trust Symposium (AsianHOST), 2017. ( received the best paper award ) [pre-print]
  17. M. T. Rahman, D. Forte, and M. Tehranipoor, “SRAM Inspired Design and Optimization for Developing Robust Security Primitives,” in SRC TECHCON, September 2016. ( Received best in Session )
  18. Guo, M. T. Rahman, M. Tehranipoor, D. Forte, “A Zero-cost Approach to Detect Recycled SoCs Using Embedded SRAM,” Hardware-Oriented Security and Trust (HOST) 2016, May 2016.link
  19.  M. T. Rahman, D. Forte, X. Wang, M. Tehranipoor, “Enhancing Noise Sensitivity of Embedded SRAMs for Robust True Random Number Generation in SoCs,” IEEE Asian Hardware-Oriented Security and Trust (AsianHOST), Dec. 2016.
  20. M. T. Rahman, D. Forte, F. Rahman, M. Tehranipoor, “A Pair Selection Algorithm for Robust RO-PUF Against Environmental Variations and Aging,” in IEEE International Conference on Computer Design (ICCD), Oct. 2015.
  21. M. T. Rahman, D. Forte, and M. Tehranipoor, “Robust SRAM-PUF: Cell Stability Analysis and Novel Bit-Selection Algorithm, “TECHCON, 2015. [pdf]
  22. M. T. Rahman, A. Hosey, K. Xiao, D. Forte, and M. Tehranipoor, “Cell Stability Analysis and Novel Bit-Selection Algorithm for Robust SRAM-PUF, “Connecticut Microelectronic Symposium (CMOC), 2015.
  23. N. Karimianbahnemiri, F. Tehranipoor, M. T. Rahman, D. Forte, “Genetic Algorithm for Hardware Trojan Detection with Ring Oscillator Network (RON),” IEEE International Conference on Technologies for Homeland Security (HST), April 2015. [pdf]
  24. M. T. Rahman, A. Hosey, F. Rahman, D. Forte, M. Tehranipoor, “RePa: A Pair Selection Algorithm for Reliable Keys from RO-based PUF” in GOMACTech, March 2015.
  25. A. Hosey, M. T. Rahman, K. Xiao, D. Forte, M. Tehranipoor, “Advanced Analysis of Cell Stability for Reliable SRAM PUF,” in IEEE Asian Test Symposium (ATS), November 2014.
  26. M. T. Rahman, D. Forte, Q. Shi, G. Contreras, M. Tehranipoor, “CSST: Preventing Distribution of Unlicensed and Rejected ICs by Untrusted Foundry and Assembly,” IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Oct. 2014.
  27. M. T. Rahman, K. Xiao, D. Forte, X. Zhang, Z. Shi, M. Tehranipoor, “TI-TRNG: Technology Independent True Random Number Generator,” Design Automation Conference (DAC), June 2014 (Richard Newton Young Student Fellow).
  28. M. T. Rahman, D. Forte, Q. Shi, G. Contreras, M. Tehranipoor, “CSST: An Efficient Secure Split-Test for Preventing IC Piracy,” IEEE North Atlantic Test Workshop (NATW), May 2014.
  29. K. Xiao, M. T. Rahman, D. Forte, M. Su, Y. Huang, M.Tehranipoor, “Bit Selection Algorithm Suitable for High-Volume Production of SRAM-PUF,” in Hardware-Oriented Security and Trust (HOST), May 2014.
  30. M. T. Rahman, D. Forte, J. Fahrny, M. Tehranipoor, “ARO-PUF: An Aging-Resistant Ring Oscillator PUF Design,” Design, Automation, & Test in Europe (DATE), March 2014.
  31. K. Xiao, Md. Tauhidur Rahman, Domenic Forte, and M. Tehranipoor, “Low-cost Analysis of SRAM PUFs for Identification of Mass-Produced Electronic Devices” -GOMACTech-2014.
  32. G. Contreras, M. T. Rahman, and M. Tehranipoor, “Secure Split-Test for Preventing IC Piracy by Untrusted Foundry and Assembly,” Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT),2-4 October 2013, NY.
  33. M Hasan, M. T. Rahman, M Hasan, A Rashid, and A Patwary, “A Novel Match-line Charging Control Scheme with a New Sense Amplifier for High-Speed and Low-Power Content-Addressable Memory,” in Solid State and Device Materials, Japan-2008.

Patents

  1. M. T. Rahman and B. M. S. Bahar Talukder, “Systems and methods for identifying counterfeit memory” United States PATENT [Link]
  2. B. Ray and M. T. Rahman, “Methods for Detection of Recycled Flash Memory” United States PATENT [Link]

Posters

  1. Farah Ferdaus, B. M. S. Bahar Talukder, and M. T. Rahman, “Attesting SRAM Manufacturer: Toward the Avoidance of Counterfeit SRAM” HOST WISE, 2019. ( Farah received a travel grant )
  2. P. Kumari, M. T. Rahman, and B. Ray “Recycled Flash Memory: Challenges and Solutions,” in the Second Workshop for Women in Hardware and Systems Security (WISE), 2018.